Making the most of your electrons: Challenges and opportunities in characterizing hybrid interfaces with STEM (Journal Article) | NSF PAGES

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Citation Details

Making the most of your electrons: Challenges and opportunities in characterizing hybrid interfaces with STEM

Award ID(s):: 1929356

NSF-PAR ID:: 10280301

Author(s) / Creator(s):: Ribet, Stephanie M.; Murthy, Akshay A.; Roth, Eric W.; dos Reis, Roberto; Dravid, Vinayak P.

Date Published:: 2021-06-01

Journal Name:: Materials Today

ISSN:: 1369-7021

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1016/j.mattod.2021.05.006