Kelley, Mathew L., Simin, Grigory, Hussain, Kamal, Khan, Asif, Greytak, Andrew B., and Chandrashekhar, M. V. Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction. Retrieved from https://par.nsf.gov/biblio/10293929. Applied Physics Letters 118.22 Web. doi:10.1063/5.0046439.

Kelley, Mathew L., Simin, Grigory, Hussain, Kamal, Khan, Asif, Greytak, Andrew B., & Chandrashekhar, M. V. Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction. Applied Physics Letters, 118 (22). Retrieved from https://par.nsf.gov/biblio/10293929. https://doi.org/10.1063/5.0046439

Kelley, Mathew L., Simin, Grigory, Hussain, Kamal, Khan, Asif, Greytak, Andrew B., and Chandrashekhar, M. V. "Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction". Applied Physics Letters 118 (22). Country unknown/Code not available. https://doi.org/10.1063/5.0046439. https://par.nsf.gov/biblio/10293929.

@article{osti_10293929,
place = {Country unknown/Code not available}, title = {Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction}, url = {https://par.nsf.gov/biblio/10293929}, DOI = {10.1063/5.0046439}, abstractNote = {}, journal = {Applied Physics Letters}, volume = {118}, number = {22}, author = {Kelley, Mathew L. and Simin, Grigory and Hussain, Kamal and Khan, Asif and Greytak, Andrew B. and Chandrashekhar, M. V.}, editor = {null} }