Das, Debayan, Danial, Josef, Golder, Anupam, Ghosh, Santosh, Wdhury, Arijit Raycho, and Sen, Shreyas. Deep Learning Side-Channel Attack Resilient AES-256 using Current Domain Signature Attenuation in 65nm CMOS. Retrieved from https://par.nsf.gov/biblio/10297502. 2020 IEEE Custom Integrated Circuits Conference (CICC) . Web. doi:10.1109/CICC48029.2020.9075889.

Das, Debayan, Danial, Josef, Golder, Anupam, Ghosh, Santosh, Wdhury, Arijit Raycho, & Sen, Shreyas. Deep Learning Side-Channel Attack Resilient AES-256 using Current Domain Signature Attenuation in 65nm CMOS. 2020 IEEE Custom Integrated Circuits Conference (CICC), (). Retrieved from https://par.nsf.gov/biblio/10297502. https://doi.org/10.1109/CICC48029.2020.9075889

Das, Debayan, Danial, Josef, Golder, Anupam, Ghosh, Santosh, Wdhury, Arijit Raycho, and Sen, Shreyas. "Deep Learning Side-Channel Attack Resilient AES-256 using Current Domain Signature Attenuation in 65nm CMOS". 2020 IEEE Custom Integrated Circuits Conference (CICC) (). Country unknown/Code not available. https://doi.org/10.1109/CICC48029.2020.9075889. https://par.nsf.gov/biblio/10297502.

@article{osti_10297502,
place = {Country unknown/Code not available}, title = {Deep Learning Side-Channel Attack Resilient AES-256 using Current Domain Signature Attenuation in 65nm CMOS}, url = {https://par.nsf.gov/biblio/10297502}, DOI = {10.1109/CICC48029.2020.9075889}, abstractNote = {}, journal = {2020 IEEE Custom Integrated Circuits Conference (CICC)}, author = {Das, Debayan and Danial, Josef and Golder, Anupam and Ghosh, Santosh and Wdhury, Arijit Raycho and Sen, Shreyas}, editor = {null} }