Influence of Intrinsic Thermal Stability on Switching Rate and Tunability of Dual-Biased Magnetic Tunnel Junctions for Probabilistic Bits
- Award ID(s):
- 1739635
- NSF-PAR ID:
- 10298234
- Date Published:
- Journal Name:
- IEEE Magnetics Letters
- Volume:
- 12
- ISSN:
- 1949-307X
- Page Range / eLocation ID:
- 1 to 5
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1109/LMAG.2021.3084901
