Influence of Intrinsic Thermal Stability on Switching Rate and Tunability of Dual-Biased Magnetic Tunnel Junctions for Probabilistic Bits
- Award ID(s):
- 1739635
- Publication Date:
- NSF-PAR ID:
- 10298234
- Journal Name:
- IEEE Magnetics Letters
- Volume:
- 12
- Page Range or eLocation-ID:
- 1 to 5
- ISSN:
- 1949-307X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Publisher's Version of Record
- https://doi.org/10.1109/LMAG.2021.3084901
