Planning accelerated life tests with multiple sources of random effects (Journal Article) | NSF PAGES

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Citation Details

Planning accelerated life tests with multiple sources of random effects

Award ID(s):: 1726445

NSF-PAR ID:: 10298622

Author(s) / Creator(s):: Seo, Kangwon; Pan, Rong

Date Published:: 2020-01-01

Journal Name:: Journal of Quality Technology

ISSN:: 0022-4065

Page Range / eLocation ID:: 1 to 22

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1080/00224065.2020.1829214