skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Explore Research Products in the PAR
It may take a few hours for recently added research products to appear in PAR search results.


  • Home
  • Search Results
  • Page 1 of 3

Search for: All records

Award ID contains: 1726445

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. ; ; (, Applied Stochastic Models in Business and Industry)
    Abstract Step‐stress accelerated degradation testing (SSADT) has become a common approach to predicting lifetime for highly reliable products that are unlikely to fail in a reasonable time under use conditions or even elevated stress conditions. In literature, the planning of SSADT has been widely investigated for stochastic degradation processes, such as Wiener processes and gamma processes. In this paper, we model the optimal SSADT planning problem from a Bayesian perspective and optimize test plans by determining both stress levels and the allocation of inspections. Large‐sample approximation is used to derive the asymptotic Bayesian utility functions under 3 planning criteria. A revisited LED lamp example is presented to illustrate our method. The comparison with optimal plans from previous studies demonstrates the necessity of considering the stress levels and inspection allocations simultaneously. 
    more » « less
  2. ; (, Computers & Industrial Engineering)
    null (Ed.)
    Full Text Available 
  3. (, 2022 Proceedings of Annual Reliability and Maintainability Symposium, IEEE)
    Accepted Manuscript Full Text Available
  4. ; (, 2022 Proceedings of Annual Reliability and Maintainability Symposium, IEEE)
    Accepted Manuscript Full Text Available
  5. ; ; (, International Journal of Production Research)
    null (Ed.)
    Full Text Available 
  6. ; (, Journal of Multivariate Analysis)
    null (Ed.)
    Full Text Available 
  7. ; (, Journal of Quality Technology)
    null (Ed.)
    Full Text Available 
  8. ; ; (, Journal of statistical theory and practice)
    null (Ed.)
    Accepted Manuscript Full Text Available
  9. ; ; (, 2021 Proceedings of Annual Reliability and Maintainability Symposium, IEEE)
    null (Ed.)
    Accepted Manuscript Full Text Available
  10. ; ; (, IEEE Transactions on Industrial Electronics)
    null (Ed.)
    Full Text Available