A Self-Test Framework for Detecting Fault-induced Accuracy Drop in Neural Network Accelerators
- Award ID(s):
- 1909854
- NSF-PAR ID:
- 10300389
- Date Published:
- Journal Name:
- Proceedings of the 26th Asia and South Pacific Design Automation Conference
- Page Range / eLocation ID:
- 722 to 727
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1145/3394885.3431519
