Atomic layer deposition of TiN/Ru gate in InP MOSFETs
- Award ID(s):
- 1640030
- PAR ID:
- 10300860
- Date Published:
- Journal Name:
- Applied Physics Letters
- Volume:
- 119
- Issue:
- 12
- ISSN:
- 0003-6951
- Page Range / eLocation ID:
- 123502
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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