Chugunov, Ilya, Baek, Seung-Hwan, Fu, Qiang, Heidrich, Wolfgang, and Heide, Felix. Mask-ToF: Learning Microlens Masks for Flying Pixel Correction in Time-of-Flight Imaging. Retrieved from https://par.nsf.gov/biblio/10301668. Conference on Computer Vision and Pattern Recognition (CVPR 2021) . Web. doi:10.1109/cvpr46437.2021.00900.

Chugunov, Ilya, Baek, Seung-Hwan, Fu, Qiang, Heidrich, Wolfgang, & Heide, Felix. Mask-ToF: Learning Microlens Masks for Flying Pixel Correction in Time-of-Flight Imaging. Conference on Computer Vision and Pattern Recognition (CVPR 2021), (). Retrieved from https://par.nsf.gov/biblio/10301668. https://doi.org/10.1109/cvpr46437.2021.00900

Chugunov, Ilya, Baek, Seung-Hwan, Fu, Qiang, Heidrich, Wolfgang, and Heide, Felix. "Mask-ToF: Learning Microlens Masks for Flying Pixel Correction in Time-of-Flight Imaging". Conference on Computer Vision and Pattern Recognition (CVPR 2021) (). Country unknown/Code not available. https://doi.org/10.1109/cvpr46437.2021.00900. https://par.nsf.gov/biblio/10301668.

@article{osti_10301668,
place = {Country unknown/Code not available}, title = {Mask-ToF: Learning Microlens Masks for Flying Pixel Correction in Time-of-Flight Imaging}, url = {https://par.nsf.gov/biblio/10301668}, DOI = {10.1109/cvpr46437.2021.00900}, abstractNote = {}, journal = {Conference on Computer Vision and Pattern Recognition (CVPR 2021)}, author = {Chugunov, Ilya and Baek, Seung-Hwan and Fu, Qiang and Heidrich, Wolfgang and Heide, Felix}, editor = {null} }