Chen, Xiaoshuang, Seto, Takafumi, Kortshagen, Uwe R., and Hogan, Christopher J.. Size and structural characterization of Si nanocrystal aggregates from a low pressure nonthermal plasma reactor. Retrieved from https://par.nsf.gov/biblio/10310094. Powder Technology 373.C Web. doi:10.1016/j.powtec.2020.06.026.

Chen, Xiaoshuang, Seto, Takafumi, Kortshagen, Uwe R., & Hogan, Christopher J.. Size and structural characterization of Si nanocrystal aggregates from a low pressure nonthermal plasma reactor. Powder Technology, 373 (C). Retrieved from https://par.nsf.gov/biblio/10310094. https://doi.org/10.1016/j.powtec.2020.06.026

Chen, Xiaoshuang, Seto, Takafumi, Kortshagen, Uwe R., and Hogan, Christopher J.. "Size and structural characterization of Si nanocrystal aggregates from a low pressure nonthermal plasma reactor". Powder Technology 373 (C). Country unknown/Code not available. https://doi.org/10.1016/j.powtec.2020.06.026. https://par.nsf.gov/biblio/10310094.

@article{osti_10310094,
place = {Country unknown/Code not available}, title = {Size and structural characterization of Si nanocrystal aggregates from a low pressure nonthermal plasma reactor}, url = {https://par.nsf.gov/biblio/10310094}, DOI = {10.1016/j.powtec.2020.06.026}, abstractNote = {}, journal = {Powder Technology}, volume = {373}, number = {C}, author = {Chen, Xiaoshuang and Seto, Takafumi and Kortshagen, Uwe R. and Hogan, Christopher J.}, }