Golmohamadi, Marcia, Jurasek, Ryan, Hokenmaier, Wolfgang, Labrecque, Don, Zhi, Ruoyu, Dale, Bret, Islam, Nibir, Kinney, Dave, and Johnson, Angela. Verification and Testing Considerations of an In-Memory AI Chip. Retrieved from https://par.nsf.gov/biblio/10311267. 2020 IEEE 29th North Atlantic Test Workshop (NATW) . Web. doi:10.1109/NATW49237.2020.9153079.

Golmohamadi, Marcia, Jurasek, Ryan, Hokenmaier, Wolfgang, Labrecque, Don, Zhi, Ruoyu, Dale, Bret, Islam, Nibir, Kinney, Dave, & Johnson, Angela. Verification and Testing Considerations of an In-Memory AI Chip. 2020 IEEE 29th North Atlantic Test Workshop (NATW), (). Retrieved from https://par.nsf.gov/biblio/10311267. https://doi.org/10.1109/NATW49237.2020.9153079

Golmohamadi, Marcia, Jurasek, Ryan, Hokenmaier, Wolfgang, Labrecque, Don, Zhi, Ruoyu, Dale, Bret, Islam, Nibir, Kinney, Dave, and Johnson, Angela. "Verification and Testing Considerations of an In-Memory AI Chip". 2020 IEEE 29th North Atlantic Test Workshop (NATW) (). Country unknown/Code not available. https://doi.org/10.1109/NATW49237.2020.9153079. https://par.nsf.gov/biblio/10311267.

@article{osti_10311267,
place = {Country unknown/Code not available}, title = {Verification and Testing Considerations of an In-Memory AI Chip}, url = {https://par.nsf.gov/biblio/10311267}, DOI = {10.1109/NATW49237.2020.9153079}, abstractNote = {}, journal = {2020 IEEE 29th North Atlantic Test Workshop (NATW)}, author = {Golmohamadi, Marcia and Jurasek, Ryan and Hokenmaier, Wolfgang and Labrecque, Don and Zhi, Ruoyu and Dale, Bret and Islam, Nibir and Kinney, Dave and Johnson, Angela}, }