Two-step write–verify scheme and impact of the read noise in multilevel RRAM-based inference engine
- Award ID(s):
- 1740225
- NSF-PAR ID:
- 10312269
- Date Published:
- Journal Name:
- Semiconductor Science and Technology
- Volume:
- 35
- Issue:
- 11
- ISSN:
- 0268-1242
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1088/1361-6641/abb842
