Meiguni, Javad, Zhou, Jianchi, Maghlakelidze, Giorgi, Xu, Yang, Hoseini Izadi, Omid, Marathe, Shubhankar, Shen, Li, Bub, Sergej, Holland, Steffen, Beetner, Daryl, and Pommerenke, David. Transient Analysis of ESD Protection Circuits for High-Speed ICs. Retrieved from https://par.nsf.gov/biblio/10313035. IEEE Transactions on Electromagnetic Compatibility 63.5 Web. doi:10.1109/TEMC.2021.3071644.

Meiguni, Javad, Zhou, Jianchi, Maghlakelidze, Giorgi, Xu, Yang, Hoseini Izadi, Omid, Marathe, Shubhankar, Shen, Li, Bub, Sergej, Holland, Steffen, Beetner, Daryl, & Pommerenke, David. Transient Analysis of ESD Protection Circuits for High-Speed ICs. IEEE Transactions on Electromagnetic Compatibility, 63 (5). Retrieved from https://par.nsf.gov/biblio/10313035. https://doi.org/10.1109/TEMC.2021.3071644

Meiguni, Javad, Zhou, Jianchi, Maghlakelidze, Giorgi, Xu, Yang, Hoseini Izadi, Omid, Marathe, Shubhankar, Shen, Li, Bub, Sergej, Holland, Steffen, Beetner, Daryl, and Pommerenke, David. "Transient Analysis of ESD Protection Circuits for High-Speed ICs". IEEE Transactions on Electromagnetic Compatibility 63 (5). Country unknown/Code not available. https://doi.org/10.1109/TEMC.2021.3071644. https://par.nsf.gov/biblio/10313035.

@article{osti_10313035,
place = {Country unknown/Code not available}, title = {Transient Analysis of ESD Protection Circuits for High-Speed ICs}, url = {https://par.nsf.gov/biblio/10313035}, DOI = {10.1109/TEMC.2021.3071644}, abstractNote = {}, journal = {IEEE Transactions on Electromagnetic Compatibility}, volume = {63}, number = {5}, author = {Meiguni, Javad and Zhou, Jianchi and Maghlakelidze, Giorgi and Xu, Yang and Hoseini Izadi, Omid and Marathe, Shubhankar and Shen, Li and Bub, Sergej and Holland, Steffen and Beetner, Daryl and Pommerenke, David}, }