FPGAs are being used in large numbers within cloud computing to provide high-performance, low-power alternatives to more traditional computing structures. While FPGAs provide a number of important benefits to cloud computing environments, they are susceptible to radiation-induced soft errors, which can lead to silent data corruption or system instability. Although soft errors within a single FPGA occur infrequently, soft errors in large-scale FPGAs systems can occur at a relatively high rate. This paper investigates the failure rate of several FPGA applications running within an FPGA cloud computing node by performing fault injection experiments to determine the susceptibility of these applications to soft-errors. The results from these experiments suggest that silent data corruption will occur every few hours within a 100,000 node FPGA system and that such a system can only maintain high-levels of reliability for short periods of operation. These results suggest that soft-error detection and mitigation techniques may be needed in large-scale FPGA systems.
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The Impact of Terrestrial Radiation on FPGAs in Data Centers
Field programmable gate arrays (FPGAs) are used in large numbers in data centers around the world. They are used for cloud computing and computer networking. The most common type of FPGA used in data centers are re-programmable SRAM-based FPGAs. These devices offer potential performance and power consumption savings. A single device also carries a small susceptibility to radiation-induced soft errors, which can lead to unexpected behavior. This article examines the impact of terrestrial radiation on FPGAs in data centers. Results from artificial fault injection and accelerated radiation testing on several data-center-like FPGA applications are compared. A new fault injection scheme provides results that are more similar to radiation testing. Silent data corruption (SDC) is the most commonly observed failure mode followed by FPGA unavailable and host unresponsive. A hypothetical deployment of 100,000 FPGAs in Denver, Colorado, will experience upsets in configuration memory every half-hour on average and SDC failures every 0.5–11 days on average.
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- Award ID(s):
- 1738550
- NSF-PAR ID:
- 10316156
- Date Published:
- Journal Name:
- ACM Transactions on Reconfigurable Technology and Systems
- Volume:
- 15
- Issue:
- 2
- ISSN:
- 1936-7406
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1145/3457198
