Special Session: Reliability Analysis for AI/ML Hardware (Conference Paper) | NSF PAGES

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Citation Details

Special Session: Reliability Analysis for AI/ML Hardware

Award ID(s):: 1942697

NSF-PAR ID:: 10317045

Author(s) / Creator(s):: Kundu, Shamik; Basu, Kanad; Sadi, Mehdi; Titirsha, Twisha; Song, Shihao; Das, Anup; Guin, Ujjwal

Date Published:: 2021-04-25

Journal Name:: 2021 IEEE 39th VLSI Test Symposium (VTS)

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.1109/VTS50974.2021.9441050