Chen, Jinbo, Lu, Chengcheng, Ni, Jiacheng, Guo, Xiaochen, Girard, Patrick, and Cheng, Yuanqing. DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect. Retrieved from https://par.nsf.gov/biblio/10319375. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29.7 Web. doi:10.1109/TVLSI.2021.3073415.

Chen, Jinbo, Lu, Chengcheng, Ni, Jiacheng, Guo, Xiaochen, Girard, Patrick, & Cheng, Yuanqing. DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 29 (7). Retrieved from https://par.nsf.gov/biblio/10319375. https://doi.org/10.1109/TVLSI.2021.3073415

Chen, Jinbo, Lu, Chengcheng, Ni, Jiacheng, Guo, Xiaochen, Girard, Patrick, and Cheng, Yuanqing. "DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (7). Country unknown/Code not available. https://doi.org/10.1109/TVLSI.2021.3073415. https://par.nsf.gov/biblio/10319375.

@article{osti_10319375,
place = {Country unknown/Code not available}, title = {DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect}, url = {https://par.nsf.gov/biblio/10319375}, DOI = {10.1109/TVLSI.2021.3073415}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {29}, number = {7}, author = {Chen, Jinbo and Lu, Chengcheng and Ni, Jiacheng and Guo, Xiaochen and Girard, Patrick and Cheng, Yuanqing}, }