Hu, Jianwei, Zhang, Jingfei, Qin, Hong, Yan, Ting, and Zhu, Ji. Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models. Retrieved from https://par.nsf.gov/biblio/10320938. Journal of the American Statistical Association 116.535 Web. doi:10.1080/01621459.2020.1722676.

Hu, Jianwei, Zhang, Jingfei, Qin, Hong, Yan, Ting, & Zhu, Ji. Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models. Journal of the American Statistical Association, 116 (535). Retrieved from https://par.nsf.gov/biblio/10320938. https://doi.org/10.1080/01621459.2020.1722676

Hu, Jianwei, Zhang, Jingfei, Qin, Hong, Yan, Ting, and Zhu, Ji. "Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models". Journal of the American Statistical Association 116 (535). Country unknown/Code not available. https://doi.org/10.1080/01621459.2020.1722676. https://par.nsf.gov/biblio/10320938.

@article{osti_10320938,
place = {Country unknown/Code not available}, title = {Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models}, url = {https://par.nsf.gov/biblio/10320938}, DOI = {10.1080/01621459.2020.1722676}, abstractNote = {}, journal = {Journal of the American Statistical Association}, volume = {116}, number = {535}, author = {Hu, Jianwei and Zhang, Jingfei and Qin, Hong and Yan, Ting and Zhu, Ji}, }