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Title: Quantitative Determination of Native Point‐Defect Concentrations at the ppm Level in Un‐Doped BaSnO 3 Thin Films
Award ID(s):
2011401
PAR ID:
10324193
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ;
Date Published:
Journal Name:
Advanced Functional Materials
ISSN:
1616-301X
Page Range / eLocation ID:
2113023
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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