Schmalbach, Kevin M., Lin, Albert C., Bufford, Daniel C., Wang, Chenguang, Sun, Changquan Calvin, and Mara, Nathan A. Nanomechanical mapping and strain rate sensitivity of microcrystalline cellulose. Retrieved from https://par.nsf.gov/biblio/10324216. Journal of Materials Research 36.11 Web. doi:10.1557/s43578-021-00138-0.

Schmalbach, Kevin M., Lin, Albert C., Bufford, Daniel C., Wang, Chenguang, Sun, Changquan Calvin, & Mara, Nathan A. Nanomechanical mapping and strain rate sensitivity of microcrystalline cellulose. Journal of Materials Research, 36 (11). Retrieved from https://par.nsf.gov/biblio/10324216. https://doi.org/10.1557/s43578-021-00138-0

Schmalbach, Kevin M., Lin, Albert C., Bufford, Daniel C., Wang, Chenguang, Sun, Changquan Calvin, and Mara, Nathan A. "Nanomechanical mapping and strain rate sensitivity of microcrystalline cellulose". Journal of Materials Research 36 (11). Country unknown/Code not available. https://doi.org/10.1557/s43578-021-00138-0. https://par.nsf.gov/biblio/10324216.

@article{osti_10324216,
place = {Country unknown/Code not available}, title = {Nanomechanical mapping and strain rate sensitivity of microcrystalline cellulose}, url = {https://par.nsf.gov/biblio/10324216}, DOI = {10.1557/s43578-021-00138-0}, abstractNote = {}, journal = {Journal of Materials Research}, volume = {36}, number = {11}, author = {Schmalbach, Kevin M. and Lin, Albert C. and Bufford, Daniel C. and Wang, Chenguang and Sun, Changquan Calvin and Mara, Nathan A.}, }