Schafer, Emily A., Wu, Ruiheng, Meli, Dilara, Tropp, Joshua, Moser, Maximilian, McCulloch, Iain, Paulsen, Bryan D., and Rivnay, Jonathan. Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors. Retrieved from https://par.nsf.gov/biblio/10329081. ACS Applied Electronic Materials 4.4 Web. doi:10.1021/acsaelm.1c01171.

Schafer, Emily A., Wu, Ruiheng, Meli, Dilara, Tropp, Joshua, Moser, Maximilian, McCulloch, Iain, Paulsen, Bryan D., & Rivnay, Jonathan. Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors. ACS Applied Electronic Materials, 4 (4). Retrieved from https://par.nsf.gov/biblio/10329081. https://doi.org/10.1021/acsaelm.1c01171

Schafer, Emily A., Wu, Ruiheng, Meli, Dilara, Tropp, Joshua, Moser, Maximilian, McCulloch, Iain, Paulsen, Bryan D., and Rivnay, Jonathan. "Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors". ACS Applied Electronic Materials 4 (4). Country unknown/Code not available. https://doi.org/10.1021/acsaelm.1c01171. https://par.nsf.gov/biblio/10329081.

@article{osti_10329081,
place = {Country unknown/Code not available}, title = {Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors}, url = {https://par.nsf.gov/biblio/10329081}, DOI = {10.1021/acsaelm.1c01171}, abstractNote = {}, journal = {ACS Applied Electronic Materials}, volume = {4}, number = {4}, author = {Schafer, Emily A. and Wu, Ruiheng and Meli, Dilara and Tropp, Joshua and Moser, Maximilian and McCulloch, Iain and Paulsen, Bryan D. and Rivnay, Jonathan}, }