Arrington, J., Bane, J., Daniel, A., Fomin, N., Gaskell, D., Seely, J., Asaturyan, R., Benmokhtar, F., Boeglin, W., Bosted, P., Bukhari, M. H., Christy, M. E., Connell, S., Dalton, M. M., Day, D., Dunne, J., Dutta, D., El Fassi, L., Ent, R., Fenker, H., Gao, H., Holt, R. J., Horn, T., Hungerford, E., Jones, M. K., Jourdan, J., Kalantarians, N., Keppel, C. E., Kiselev, D., Lung, A. F., Malace, S., Meekins, D. G., Mertens, T., Mkrtchyan, H., Niculescu, G., Niculescu, I., Potterveld, D. H., Perdrisat, C., Punjabi, V., Qian, X., Reimer, P. E., Roche, J., Rodriguez, V. M., Rondon, O., Schulte, E., Slifer, K., Smith, G. R., Solvignon, P., Tadevosyan, V., Tang, L., Testa, G., Trojer, R., Tvaskis, V., Wesselmann, F. R., Wood, S. A., Yuan, L., and Zheng, X. Measurement of the EMC effect in light and heavy nuclei. Retrieved from https://par.nsf.gov/biblio/10329619. Physical review and Physical review letters index 104. Web. doi:10.1103/PhysRevC.104.065203.

Arrington, J., Bane, J., Daniel, A., Fomin, N., Gaskell, D., Seely, J., Asaturyan, R., Benmokhtar, F., Boeglin, W., Bosted, P., Bukhari, M. H., Christy, M. E., Connell, S., Dalton, M. M., Day, D., Dunne, J., Dutta, D., El Fassi, L., Ent, R., Fenker, H., Gao, H., Holt, R. J., Horn, T., Hungerford, E., Jones, M. K., Jourdan, J., Kalantarians, N., Keppel, C. E., Kiselev, D., Lung, A. F., Malace, S., Meekins, D. G., Mertens, T., Mkrtchyan, H., Niculescu, G., Niculescu, I., Potterveld, D. H., Perdrisat, C., Punjabi, V., Qian, X., Reimer, P. E., Roche, J., Rodriguez, V. M., Rondon, O., Schulte, E., Slifer, K., Smith, G. R., Solvignon, P., Tadevosyan, V., Tang, L., Testa, G., Trojer, R., Tvaskis, V., Wesselmann, F. R., Wood, S. A., Yuan, L., & Zheng, X. Measurement of the EMC effect in light and heavy nuclei. Physical review and Physical review letters index, 104 (). Retrieved from https://par.nsf.gov/biblio/10329619. https://doi.org/10.1103/PhysRevC.104.065203

Arrington, J., Bane, J., Daniel, A., Fomin, N., Gaskell, D., Seely, J., Asaturyan, R., Benmokhtar, F., Boeglin, W., Bosted, P., Bukhari, M. H., Christy, M. E., Connell, S., Dalton, M. M., Day, D., Dunne, J., Dutta, D., El Fassi, L., Ent, R., Fenker, H., Gao, H., Holt, R. J., Horn, T., Hungerford, E., Jones, M. K., Jourdan, J., Kalantarians, N., Keppel, C. E., Kiselev, D., Lung, A. F., Malace, S., Meekins, D. G., Mertens, T., Mkrtchyan, H., Niculescu, G., Niculescu, I., Potterveld, D. H., Perdrisat, C., Punjabi, V., Qian, X., Reimer, P. E., Roche, J., Rodriguez, V. M., Rondon, O., Schulte, E., Slifer, K., Smith, G. R., Solvignon, P., Tadevosyan, V., Tang, L., Testa, G., Trojer, R., Tvaskis, V., Wesselmann, F. R., Wood, S. A., Yuan, L., and Zheng, X. "Measurement of the EMC effect in light and heavy nuclei". Physical review and Physical review letters index 104 (). Country unknown/Code not available. https://doi.org/10.1103/PhysRevC.104.065203. https://par.nsf.gov/biblio/10329619.

@article{osti_10329619,
place = {Country unknown/Code not available}, title = {Measurement of the EMC effect in light and heavy nuclei}, url = {https://par.nsf.gov/biblio/10329619}, DOI = {10.1103/PhysRevC.104.065203}, abstractNote = {}, journal = {Physical review and Physical review letters index}, volume = {104}, author = {Arrington, J. and Bane, J. and Daniel, A. and Fomin, N. and Gaskell, D. and Seely, J. and Asaturyan, R. and Benmokhtar, F. and Boeglin, W. and Bosted, P. and Bukhari, M. H. and Christy, M. E. and Connell, S. and Dalton, M. M. and Day, D. and Dunne, J. and Dutta, D. and El Fassi, L. and Ent, R. and Fenker, H. and Gao, H. and Holt, R. J. and Horn, T. and Hungerford, E. and Jones, M. K. and Jourdan, J. and Kalantarians, N. and Keppel, C. E. and Kiselev, D. and Lung, A. F. and Malace, S. and Meekins, D. G. and Mertens, T. and Mkrtchyan, H. and Niculescu, G. and Niculescu, I. and Potterveld, D. H. and Perdrisat, C. and Punjabi, V. and Qian, X. and Reimer, P. E. and Roche, J. and Rodriguez, V. M. and Rondon, O. and Schulte, E. and Slifer, K. and Smith, G. R. and Solvignon, P. and Tadevosyan, V. and Tang, L. and Testa, G. and Trojer, R. and Tvaskis, V. and Wesselmann, F. R. and Wood, S. A. and Yuan, L. and Zheng, X.}, }