Estimating Operational Age of an Integrated Circuit
- Award ID(s):
- 1755733
- NSF-PAR ID:
- 10333669
- Date Published:
- Journal Name:
- Journal of Electronic Testing
- Volume:
- 37
- Issue:
- 1
- ISSN:
- 0923-8174
- Page Range / eLocation ID:
- 25 to 40
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1007/s10836-021-05927-3
