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Title: Differential electron yield imaging with STXM
Award ID(s):
2004897 1611036
PAR ID:
10334649
Author(s) / Creator(s):
; ; ; ; ; ;
Date Published:
Journal Name:
Ultramicroscopy
Volume:
222
Issue:
C
ISSN:
0304-3991
Page Range / eLocation ID:
113198
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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