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Title: Short-channel robustness from negative capacitance in 2D NC-FETs
Award ID(s):
1915814
NSF-PAR ID:
10336466
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Applied Physics Letters
Volume:
118
Issue:
10
ISSN:
0003-6951
Page Range / eLocation ID:
101903
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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