Bai, Aofeng, Hilse, Maria, Patil, Prasanna D., Engel-Herbet, Roman, and Peiris, Frank. Probing the growth quality of molecular beam epitaxy-grown Bi2Se3 films via in-situ spectroscopic ellipsometry. Retrieved from https://par.nsf.gov/biblio/10336983. Journal of Crystal Growth 591.C Web. doi:10.1016/j.jcrysgro.2022.126714.

Bai, Aofeng, Hilse, Maria, Patil, Prasanna D., Engel-Herbet, Roman, & Peiris, Frank. Probing the growth quality of molecular beam epitaxy-grown Bi2Se3 films via in-situ spectroscopic ellipsometry. Journal of Crystal Growth, 591 (C). Retrieved from https://par.nsf.gov/biblio/10336983. https://doi.org/10.1016/j.jcrysgro.2022.126714

Bai, Aofeng, Hilse, Maria, Patil, Prasanna D., Engel-Herbet, Roman, and Peiris, Frank. "Probing the growth quality of molecular beam epitaxy-grown Bi2Se3 films via in-situ spectroscopic ellipsometry". Journal of Crystal Growth 591 (C). Country unknown/Code not available. https://doi.org/10.1016/j.jcrysgro.2022.126714. https://par.nsf.gov/biblio/10336983.

@article{osti_10336983,
place = {Country unknown/Code not available}, title = {Probing the growth quality of molecular beam epitaxy-grown Bi2Se3 films via in-situ spectroscopic ellipsometry}, url = {https://par.nsf.gov/biblio/10336983}, DOI = {10.1016/j.jcrysgro.2022.126714}, abstractNote = {}, journal = {Journal of Crystal Growth}, volume = {591}, number = {C}, author = {Bai, Aofeng and Hilse, Maria and Patil, Prasanna D. and Engel-Herbet, Roman and Peiris, Frank}, }