Kim, Taeyong, Oh, Saejin, Choudhry, Usama, Meinhart, Carl D., Chabinyc, Michael L., and Liao, Bolin. Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy. Retrieved from https://par.nsf.gov/biblio/10337671. Nano Letters 21.21 Web. doi:10.1021/acs.nanolett.1c02963.

Kim, Taeyong, Oh, Saejin, Choudhry, Usama, Meinhart, Carl D., Chabinyc, Michael L., & Liao, Bolin. Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy. Nano Letters, 21 (21). Retrieved from https://par.nsf.gov/biblio/10337671. https://doi.org/10.1021/acs.nanolett.1c02963

Kim, Taeyong, Oh, Saejin, Choudhry, Usama, Meinhart, Carl D., Chabinyc, Michael L., and Liao, Bolin. "Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy". Nano Letters 21 (21). Country unknown/Code not available. https://doi.org/10.1021/acs.nanolett.1c02963. https://par.nsf.gov/biblio/10337671.

@article{osti_10337671,
place = {Country unknown/Code not available}, title = {Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy}, url = {https://par.nsf.gov/biblio/10337671}, DOI = {10.1021/acs.nanolett.1c02963}, abstractNote = {}, journal = {Nano Letters}, volume = {21}, number = {21}, author = {Kim, Taeyong and Oh, Saejin and Choudhry, Usama and Meinhart, Carl D. and Chabinyc, Michael L. and Liao, Bolin}, }