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We take a random matrix theory approach to random sketching and show an asymptotic first-order equivalence of the regularized sketched pseudoinverse of a positive semidefinite matrix to a certain evaluation of the resolvent of the same matrix. We focus on real-valued regularization and extend previous results on an asymptotic equivalence of random matrices to the real setting, providing a precise characterization of the equivalence even under negative regularization, including a precise characterization of the smallest nonzero eigenvalue of the sketched matrix. We then further characterize the second-order equivalence of the sketched pseudoinverse. We also apply our results to the analysis of the sketch-and-project method and to sketched ridge regression. Last, we prove that these results generalize to asymptotically free sketching matrices, obtaining the resulting equivalence for orthogonal sketching matrices and comparing our results to several common sketches used in practice.
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A projector-based approach to quantifying total and excess uncertainties for sketched linear regression
Abstract Linear regression is a classic method of data analysis. In recent years, sketching—a method of dimension reduction using random sampling, random projections or both—has gained popularity as an effective computational approximation when the number of observations greatly exceeds the number of variables. In this paper, we address the following question: how does sketching affect the statistical properties of the solution and key quantities derived from it? To answer this question, we present a projector-based approach to sketched linear regression that is exact and that requires minimal assumptions on the sketching matrix. Therefore, downstream analyses hold exactly and generally for all sketching schemes. Additionally, a projector-based approach enables derivation of key quantities from classic linear regression that account for the combined model- and algorithm-induced uncertainties. We demonstrate the usefulness of a projector-based approach in quantifying and enabling insight on excess uncertainties and bias-variance decompositions for sketched linear regression. Finally, we demonstrate how the insights from our projector-based analyses can be used to produce practical sketching diagnostics to aid the design of judicious sketching schemes.
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- PAR ID:
- 10338023
- Date Published:
- Journal Name:
- Information and Inference: A Journal of the IMA
- ISSN:
- 2049-8772
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1093/imaiai/iaab016
