Kacher, Josh, Xie, Yao, Voigt, Sven P., Zhu, Shixiang, Yuchi, Henry, Key, Jordan, and Kalidindi, Surya R. In Situ Transmission Electron Microscopy: Signal processing challenges and examples. Retrieved from https://par.nsf.gov/biblio/10339314. IEEE Signal Processing Magazine 39.1 Web. doi:10.1109/MSP.2021.3119284.

Kacher, Josh, Xie, Yao, Voigt, Sven P., Zhu, Shixiang, Yuchi, Henry, Key, Jordan, & Kalidindi, Surya R. In Situ Transmission Electron Microscopy: Signal processing challenges and examples. IEEE Signal Processing Magazine, 39 (1). Retrieved from https://par.nsf.gov/biblio/10339314. https://doi.org/10.1109/MSP.2021.3119284

Kacher, Josh, Xie, Yao, Voigt, Sven P., Zhu, Shixiang, Yuchi, Henry, Key, Jordan, and Kalidindi, Surya R. "In Situ Transmission Electron Microscopy: Signal processing challenges and examples". IEEE Signal Processing Magazine 39 (1). Country unknown/Code not available. https://doi.org/10.1109/MSP.2021.3119284. https://par.nsf.gov/biblio/10339314.

@article{osti_10339314,
place = {Country unknown/Code not available}, title = {In Situ Transmission Electron Microscopy: Signal processing challenges and examples}, url = {https://par.nsf.gov/biblio/10339314}, DOI = {10.1109/MSP.2021.3119284}, abstractNote = {}, journal = {IEEE Signal Processing Magazine}, volume = {39}, number = {1}, author = {Kacher, Josh and Xie, Yao and Voigt, Sven P. and Zhu, Shixiang and Yuchi, Henry and Key, Jordan and Kalidindi, Surya R.}, }