Maekawa, Hiroaki, Kumar, S. K., Mukherjee, Sudipta S., and Ge, Nien-Hui. Phase-Sensitive Vibrationally Resonant Sum-Frequency Generation Microscopy in Multiplex Configuration at 80 MHz Repetition Rate. Retrieved from https://par.nsf.gov/biblio/10341088. The Journal of Physical Chemistry B 125.33 Web. doi:10.1021/acs.jpcb.1c05430.

Maekawa, Hiroaki, Kumar, S. K., Mukherjee, Sudipta S., & Ge, Nien-Hui. Phase-Sensitive Vibrationally Resonant Sum-Frequency Generation Microscopy in Multiplex Configuration at 80 MHz Repetition Rate. The Journal of Physical Chemistry B, 125 (33). Retrieved from https://par.nsf.gov/biblio/10341088. https://doi.org/10.1021/acs.jpcb.1c05430

Maekawa, Hiroaki, Kumar, S. K., Mukherjee, Sudipta S., and Ge, Nien-Hui. "Phase-Sensitive Vibrationally Resonant Sum-Frequency Generation Microscopy in Multiplex Configuration at 80 MHz Repetition Rate". The Journal of Physical Chemistry B 125 (33). Country unknown/Code not available. https://doi.org/10.1021/acs.jpcb.1c05430. https://par.nsf.gov/biblio/10341088.

@article{osti_10341088,
place = {Country unknown/Code not available}, title = {Phase-Sensitive Vibrationally Resonant Sum-Frequency Generation Microscopy in Multiplex Configuration at 80 MHz Repetition Rate}, url = {https://par.nsf.gov/biblio/10341088}, DOI = {10.1021/acs.jpcb.1c05430}, abstractNote = {}, journal = {The Journal of Physical Chemistry B}, volume = {125}, number = {33}, author = {Maekawa, Hiroaki and Kumar, S. K. and Mukherjee, Sudipta S. and Ge, Nien-Hui}, }