Klochkov, Y. Yu., Prokhorov, L. G., Matiushechkina, M. S., Adhikari, R. X., and Mitrofanov, V. P. Using silicon disk resonators to measure mechanical losses caused by an electric field. Retrieved from https://par.nsf.gov/biblio/10343735. Review of Scientific Instruments 93.1 Web. doi:10.1063/5.0076311.

Klochkov, Y. Yu., Prokhorov, L. G., Matiushechkina, M. S., Adhikari, R. X., & Mitrofanov, V. P. Using silicon disk resonators to measure mechanical losses caused by an electric field. Review of Scientific Instruments, 93 (1). Retrieved from https://par.nsf.gov/biblio/10343735. https://doi.org/10.1063/5.0076311

Klochkov, Y. Yu., Prokhorov, L. G., Matiushechkina, M. S., Adhikari, R. X., and Mitrofanov, V. P. "Using silicon disk resonators to measure mechanical losses caused by an electric field". Review of Scientific Instruments 93 (1). Country unknown/Code not available. https://doi.org/10.1063/5.0076311. https://par.nsf.gov/biblio/10343735.

@article{osti_10343735,
place = {Country unknown/Code not available}, title = {Using silicon disk resonators to measure mechanical losses caused by an electric field}, url = {https://par.nsf.gov/biblio/10343735}, DOI = {10.1063/5.0076311}, abstractNote = {}, journal = {Review of Scientific Instruments}, volume = {93}, number = {1}, author = {Klochkov, Y. Yu. and Prokhorov, L. G. and Matiushechkina, M. S. and Adhikari, R. X. and Mitrofanov, V. P.}, }