- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources3
- Resource Type
-
0000000003000000
- More
- Availability
-
30
- Author / Contributor
- Filter by Author / Creator
-
-
Adhikari, Rana_X (2)
-
Arai, Koji (2)
-
Adhikari, R. X. (1)
-
Brooks, Aidan (1)
-
Klochkov, Y. Yu. (1)
-
Matiushechkina, M. S. (1)
-
Michimura, Yuta (1)
-
Mitrofanov, V. P. (1)
-
Prokhorov, L. G. (1)
-
Salces-Carcoba, Francisco (1)
-
Salces-Cárcoba, Francisco (1)
-
Venugopalan, Gautam (1)
-
Wang, Haoyu (1)
-
Wipf, Christopher (1)
-
#Tyler Phillips, Kenneth E. (0)
-
#Willis, Ciara (0)
-
& Abreu-Ramos, E. D. (0)
-
& Abramson, C. I. (0)
-
& Abreu-Ramos, E. D. (0)
-
& Adams, S.G. (0)
-
- Filter by Editor
-
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Sahin. I. (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
(submitted - in Review for IEEE ICASSP-2024) (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
We describe the design of optimized multilayer dielectric coatings for precision laser interferometry. By setting up an appropriate cost function and then using a global optimizer to find a minimum in the parameter space, we were able to realize coating designs that meet the design requirements for spectral reflectivity, thermal noise, absorption, and tolerances to coating fabrication errors. We also present application of a Markov-Chain Monte Carlo (MCMC) based parameter estimation algorithm that can infer thicknesses of dielectric layers in a coating, given a measurement of the spectral reflectivity. This technique can be a powerful diagnostic tool for both commercial coating manufacturers, and the community using dielectric mirrors for precision metrology experiments.more » « less
-
Michimura, Yuta; Wang, Haoyu; Salces-Carcoba, Francisco; Wipf, Christopher; Brooks, Aidan; Arai, Koji; Adhikari, Rana_X (, Physical Review D)
-
Klochkov, Y. Yu.; Prokhorov, L. G.; Matiushechkina, M. S.; Adhikari, R. X.; Mitrofanov, V. P. (, Review of Scientific Instruments)
An official website of the United States government
