Wang, Meizhi, Iyer, Vishnuvardhan V., Xie, Shanshan, Li, Ge, Mathew, Sanu K., Kumar, Raghavan, Orshansky, Michael, Yilmaz, Ali E., and Kulkarni, Jaydeep P. Physical Design Strategies for Mitigating Fine-Grained Electromagnetic Side-Channel Attacks. Retrieved from https://par.nsf.gov/biblio/10344195. IEEE Custom Integrated Circuits Conference (CICC) . Web. doi:10.1109/CICC51472.2021.9431438.

Wang, Meizhi, Iyer, Vishnuvardhan V., Xie, Shanshan, Li, Ge, Mathew, Sanu K., Kumar, Raghavan, Orshansky, Michael, Yilmaz, Ali E., & Kulkarni, Jaydeep P. Physical Design Strategies for Mitigating Fine-Grained Electromagnetic Side-Channel Attacks. IEEE Custom Integrated Circuits Conference (CICC), (). Retrieved from https://par.nsf.gov/biblio/10344195. https://doi.org/10.1109/CICC51472.2021.9431438

Wang, Meizhi, Iyer, Vishnuvardhan V., Xie, Shanshan, Li, Ge, Mathew, Sanu K., Kumar, Raghavan, Orshansky, Michael, Yilmaz, Ali E., and Kulkarni, Jaydeep P. "Physical Design Strategies for Mitigating Fine-Grained Electromagnetic Side-Channel Attacks". IEEE Custom Integrated Circuits Conference (CICC) (). Country unknown/Code not available. https://doi.org/10.1109/CICC51472.2021.9431438. https://par.nsf.gov/biblio/10344195.

@article{osti_10344195,
place = {Country unknown/Code not available}, title = {Physical Design Strategies for Mitigating Fine-Grained Electromagnetic Side-Channel Attacks}, url = {https://par.nsf.gov/biblio/10344195}, DOI = {10.1109/CICC51472.2021.9431438}, abstractNote = {}, journal = {IEEE Custom Integrated Circuits Conference (CICC)}, author = {Wang, Meizhi and Iyer, Vishnuvardhan V. and Xie, Shanshan and Li, Ge and Mathew, Sanu K. and Kumar, Raghavan and Orshansky, Michael and Yilmaz, Ali E. and Kulkarni, Jaydeep P.}, }