Using the ANOVA F-Statistic to Isolate Information-Revealing Near-Field Measurement Configurations for Embedded Systems
- Award ID(s):
- 1901446
- PAR ID:
- 10344336
- Date Published:
- Journal Name:
- IEEE International Joint EMC/SI/PI and EMC Europe Symposium
- Page Range / eLocation ID:
- 1024 to 1029
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559360
