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Title: Variation and Stochasticity in Polycrystalline HZO based MFIM: Grain-Growth Coupled 3D Phase Field Model based Analysis
Award ID(s):
2008412
NSF-PAR ID:
10345910
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
International Electron Device Meetings (IEDM)
Page Range / eLocation ID:
15.2.1 to 15.2.4
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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