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This content will become publicly available on December 11, 2022

Title: Variation and Stochasticity in Polycrystalline HZO based MFIM: Grain-Growth Coupled 3D Phase Field Model based Analysis
Authors:
; ; ; ; ;
Award ID(s):
2008412
Publication Date:
NSF-PAR ID:
10345910
Journal Name:
International Electron Device Meetings (IEDM)
Page Range or eLocation-ID:
15.2.1 to 15.2.4
Sponsoring Org:
National Science Foundation
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