Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits
- Award ID(s):
- 1755733
- NSF-PAR ID:
- 10346609
- Date Published:
- Journal Name:
- 2022 IEEE 40th VLSI Test Symposium (VTS)
- Page Range / eLocation ID:
- 1 to 7
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/VTS52500.2021.9794254
