Dynamic Reliability Management of Multi-Gateway IoT Edge Computing Systems (Journal Article) | NSF PAGES

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Citation Details

Dynamic Reliability Management of Multi-Gateway IoT Edge Computing Systems

Award ID(s):: 2120019

NSF-PAR ID:: 10347855

Author(s) / Creator(s):: Ergun, Kazim; Ayoub, Raid; Mercati, Pietro; Rosing, Tajana

Date Published:: 2022-06-01

Journal Name:: IEEE Internet of Things Journal

ISSN:: 2372-2541

Page Range / eLocation ID:: 1 to 1

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1109/JIOT.2022.3185082