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Title: Storage-Based Built-In Self-Test for Gate-Exhaustive Faults
Award ID(s):
2041649
PAR ID:
10348029
Author(s) / Creator(s):
Date Published:
Journal Name:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume:
40
Issue:
10
ISSN:
0278-0070
Page Range / eLocation ID:
2189 to 2193
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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