Yang, Ni, Ophus, Colin, Savitzky, Benjamin H., Scott, Mary C., Bustillo, Karen, and Lu, Kathy. Nanoscale characterization of crystalline and amorphous phases in silicon oxycarbide ceramics using 4D-STEM. Retrieved from https://par.nsf.gov/biblio/10351716. Materials Characterization 181.C Web. doi:10.1016/j.matchar.2021.111512.

Yang, Ni, Ophus, Colin, Savitzky, Benjamin H., Scott, Mary C., Bustillo, Karen, & Lu, Kathy. Nanoscale characterization of crystalline and amorphous phases in silicon oxycarbide ceramics using 4D-STEM. Materials Characterization, 181 (C). Retrieved from https://par.nsf.gov/biblio/10351716. https://doi.org/10.1016/j.matchar.2021.111512

Yang, Ni, Ophus, Colin, Savitzky, Benjamin H., Scott, Mary C., Bustillo, Karen, and Lu, Kathy. "Nanoscale characterization of crystalline and amorphous phases in silicon oxycarbide ceramics using 4D-STEM". Materials Characterization 181 (C). Country unknown/Code not available. https://doi.org/10.1016/j.matchar.2021.111512. https://par.nsf.gov/biblio/10351716.

@article{osti_10351716,
place = {Country unknown/Code not available}, title = {Nanoscale characterization of crystalline and amorphous phases in silicon oxycarbide ceramics using 4D-STEM}, url = {https://par.nsf.gov/biblio/10351716}, DOI = {10.1016/j.matchar.2021.111512}, abstractNote = {}, journal = {Materials Characterization}, volume = {181}, number = {C}, author = {Yang, Ni and Ophus, Colin and Savitzky, Benjamin H. and Scott, Mary C. and Bustillo, Karen and Lu, Kathy}, }