Nanoscale Ruthenium-Containing Deposits from Ru(CO) 4 I 2 via Simultaneous Focused Electron Beam-Induced Deposition and Etching in Ultrahigh Vacuum: Mask Repair in Extreme Ultraviolet Lithography and Beyond
- Award ID(s):
- 1904802
- PAR ID:
- 10352300
- Date Published:
- Journal Name:
- ACS Applied Nano Materials
- Volume:
- 5
- Issue:
- 3
- ISSN:
- 2574-0970
- Page Range / eLocation ID:
- 3855 to 3865
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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