Beckwith, Caleb, Naicker, Harsh Sankar, Mehta, Svara, Udupa, Viba R., Nim, Nghia Tri, Gadre, Varun, Pearce, Hammond, Mac, Gary, and Gupta, Nikhil. Needle in a Haystack: Detecting Subtle Malicious Edits to Additive Manufacturing G-Code Files. Retrieved from https://par.nsf.gov/biblio/10353471. IEEE Embedded Systems Letters 14.3 Web. doi:10.1109/LES.2021.3129108.

Beckwith, Caleb, Naicker, Harsh Sankar, Mehta, Svara, Udupa, Viba R., Nim, Nghia Tri, Gadre, Varun, Pearce, Hammond, Mac, Gary, & Gupta, Nikhil. Needle in a Haystack: Detecting Subtle Malicious Edits to Additive Manufacturing G-Code Files. IEEE Embedded Systems Letters, 14 (3). Retrieved from https://par.nsf.gov/biblio/10353471. https://doi.org/10.1109/LES.2021.3129108

Beckwith, Caleb, Naicker, Harsh Sankar, Mehta, Svara, Udupa, Viba R., Nim, Nghia Tri, Gadre, Varun, Pearce, Hammond, Mac, Gary, and Gupta, Nikhil. "Needle in a Haystack: Detecting Subtle Malicious Edits to Additive Manufacturing G-Code Files". IEEE Embedded Systems Letters 14 (3). Country unknown/Code not available. https://doi.org/10.1109/LES.2021.3129108. https://par.nsf.gov/biblio/10353471.

@article{osti_10353471,
place = {Country unknown/Code not available}, title = {Needle in a Haystack: Detecting Subtle Malicious Edits to Additive Manufacturing G-Code Files}, url = {https://par.nsf.gov/biblio/10353471}, DOI = {10.1109/LES.2021.3129108}, abstractNote = {}, journal = {IEEE Embedded Systems Letters}, volume = {14}, number = {3}, author = {Beckwith, Caleb and Naicker, Harsh Sankar and Mehta, Svara and Udupa, Viba R. and Nim, Nghia Tri and Gadre, Varun and Pearce, Hammond and Mac, Gary and Gupta, Nikhil}, }