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  • Characterizing vibration-assisted atomic force microscopy (AFM)-based nanomachining via perception of acoustic emission phenomena using a sensor-based real-time monitoring approach
Title: Characterizing vibration-assisted atomic force microscopy (AFM)-based nanomachining via perception of acoustic emission phenomena using a sensor-based real-time monitoring approach
Award ID(s):
2006127
PAR ID:
10355540
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Manufacturing Letters
Volume:
34
Issue:
C
ISSN:
2213-8463
Page Range / eLocation ID:
6 to 11
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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