Khaleghi, Behnam, Mallappa, Uday, Yaldiz, Duygu, Yang, Haichao, Shah, Monil, Kang, Jaeyoung, and Rosing, Tajana. PatterNet: explore and exploit filter patterns for efficient deep neural networks. Retrieved from https://par.nsf.gov/biblio/10356059. Proceedings of the 59th ACM/IEEE Design Automation Conference . Web. doi:10.1145/3489517.3530422.

Khaleghi, Behnam, Mallappa, Uday, Yaldiz, Duygu, Yang, Haichao, Shah, Monil, Kang, Jaeyoung, & Rosing, Tajana. PatterNet: explore and exploit filter patterns for efficient deep neural networks. Proceedings of the 59th ACM/IEEE Design Automation Conference, (). Retrieved from https://par.nsf.gov/biblio/10356059. https://doi.org/10.1145/3489517.3530422

Khaleghi, Behnam, Mallappa, Uday, Yaldiz, Duygu, Yang, Haichao, Shah, Monil, Kang, Jaeyoung, and Rosing, Tajana. "PatterNet: explore and exploit filter patterns for efficient deep neural networks". Proceedings of the 59th ACM/IEEE Design Automation Conference (). Country unknown/Code not available. https://doi.org/10.1145/3489517.3530422. https://par.nsf.gov/biblio/10356059.

@article{osti_10356059,
place = {Country unknown/Code not available}, title = {PatterNet: explore and exploit filter patterns for efficient deep neural networks}, url = {https://par.nsf.gov/biblio/10356059}, DOI = {10.1145/3489517.3530422}, abstractNote = {}, journal = {Proceedings of the 59th ACM/IEEE Design Automation Conference}, author = {Khaleghi, Behnam and Mallappa, Uday and Yaldiz, Duygu and Yang, Haichao and Shah, Monil and Kang, Jaeyoung and Rosing, Tajana}, }