Routability-Aware Placement for Advanced FinFET Mixed-Signal Circuits using Satisfiability Modulo Theories (Conference Paper) | NSF PAGES

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Citation Details

Routability-Aware Placement for Advanced FinFET Mixed-Signal Circuits using Satisfiability Modulo Theories

Award ID(s):: 1704758

NSF-PAR ID:: 10356335

Author(s) / Creator(s):: Chen, Hao; Turner, Walker J.; Pan, David Z.; Ren, Haoxing

Date Published:: 2022-03-14

Journal Name:: IEEE Design, Automation & Test in Europe (DATE) Conference

Page Range / eLocation ID:: 160 to 165

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.23919/DATE54114.2022.9774766