Routability-Aware Placement for Advanced FinFET Mixed-Signal Circuits using Satisfiability Modulo Theories
- Award ID(s):
- 1704758
- Publication Date:
- NSF-PAR ID:
- 10356335
- Journal Name:
- IEEE Design, Automation & Test in Europe (DATE) Conference
- Page Range or eLocation-ID:
- 160 to 165
- Sponsoring Org:
- National Science Foundation
More Like this
No document suggestions found
- Free Publicly Accessible Full Text
-
Accepted Manuscript1.0
- Publisher's Version of Record
- https://doi.org/10.23919/DATE54114.2022.9774766
