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Title: Routability-Aware Placement for Advanced FinFET Mixed-Signal Circuits using Satisfiability Modulo Theories
Award ID(s):
1704758
PAR ID:
10356335
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
IEEE Design, Automation & Test in Europe (DATE) Conference
Page Range / eLocation ID:
160 to 165
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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