Taylor, Michael C., da Silva, Caitano L., Walker, T. Daniel, and Christian, Hugh J. Data-Driven Simulations of the Lightning Return Stroke Channel Properties. Retrieved from https://par.nsf.gov/biblio/10356788. IEEE Transactions on Electromagnetic Compatibility . Web. doi:10.1109/TEMC.2022.3189590.
Taylor, Michael C., da Silva, Caitano L., Walker, T. Daniel, & Christian, Hugh J. Data-Driven Simulations of the Lightning Return Stroke Channel Properties. IEEE Transactions on Electromagnetic Compatibility, (). Retrieved from https://par.nsf.gov/biblio/10356788. https://doi.org/10.1109/TEMC.2022.3189590
Taylor, Michael C., da Silva, Caitano L., Walker, T. Daniel, and Christian, Hugh J.
"Data-Driven Simulations of the Lightning Return Stroke Channel Properties". IEEE Transactions on Electromagnetic Compatibility (). Country unknown/Code not available. https://doi.org/10.1109/TEMC.2022.3189590.https://par.nsf.gov/biblio/10356788.
@article{osti_10356788,
place = {Country unknown/Code not available},
title = {Data-Driven Simulations of the Lightning Return Stroke Channel Properties},
url = {https://par.nsf.gov/biblio/10356788},
DOI = {10.1109/TEMC.2022.3189590},
abstractNote = {},
journal = {IEEE Transactions on Electromagnetic Compatibility},
author = {Taylor, Michael C. and da Silva, Caitano L. and Walker, T. Daniel and Christian, Hugh J.},
}
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