Fuzzy Key Generator Design using ReRAM-Based Physically Unclonable Functions
- Award ID(s):
- 2204502
- PAR ID:
- 10356840
- Date Published:
- Journal Name:
- 2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)
- Page Range / eLocation ID:
- 1 to 7
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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