Mohan, Sreyas, Manzorro, Ramon, Vincent, Joshua L., Tang, Binh, Sheth, Dev Y., Simoncelli, Eero P., Matteson, David S., Crozier, Peter A., and Fernandez-Granda, Carlos. Deep Denoising for Scientific Discovery: A Case Study in Electron Microscopy. Retrieved from https://par.nsf.gov/biblio/10359128. IEEE Transactions on Computational Imaging 8. Web. doi:10.1109/TCI.2022.3176536.

Mohan, Sreyas, Manzorro, Ramon, Vincent, Joshua L., Tang, Binh, Sheth, Dev Y., Simoncelli, Eero P., Matteson, David S., Crozier, Peter A., & Fernandez-Granda, Carlos. Deep Denoising for Scientific Discovery: A Case Study in Electron Microscopy. IEEE Transactions on Computational Imaging, 8 (). Retrieved from https://par.nsf.gov/biblio/10359128. https://doi.org/10.1109/TCI.2022.3176536

Mohan, Sreyas, Manzorro, Ramon, Vincent, Joshua L., Tang, Binh, Sheth, Dev Y., Simoncelli, Eero P., Matteson, David S., Crozier, Peter A., and Fernandez-Granda, Carlos. "Deep Denoising for Scientific Discovery: A Case Study in Electron Microscopy". IEEE Transactions on Computational Imaging 8 (). Country unknown/Code not available. https://doi.org/10.1109/TCI.2022.3176536. https://par.nsf.gov/biblio/10359128.

@article{osti_10359128,
place = {Country unknown/Code not available}, title = {Deep Denoising for Scientific Discovery: A Case Study in Electron Microscopy}, url = {https://par.nsf.gov/biblio/10359128}, DOI = {10.1109/TCI.2022.3176536}, abstractNote = {}, journal = {IEEE Transactions on Computational Imaging}, volume = {8}, author = {Mohan, Sreyas and Manzorro, Ramon and Vincent, Joshua L. and Tang, Binh and Sheth, Dev Y. and Simoncelli, Eero P. and Matteson, David S. and Crozier, Peter A. and Fernandez-Granda, Carlos}, }