A New, Computationally Efficient “Blech Criterion” for Immortality in General Interconnects
- Award ID(s):
- 1714805
- NSF-PAR ID:
- 10359378
- Date Published:
- Journal Name:
- ACM/IEEE Design Automation Conference
- Page Range / eLocation ID:
- 913 to 918
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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