Muhowski, A. J., March, S. D., Maddox, S. J., Wasserman, D., and Bank, S. R. Minority carrier lifetimes in digitally-grown, narrow-gap, AlInAsSb alloys. Applied Physics Letters 119.25 Web. doi:10.1063/5.0074304.

Muhowski, A. J., March, S. D., Maddox, S. J., Wasserman, D., & Bank, S. R. Minority carrier lifetimes in digitally-grown, narrow-gap, AlInAsSb alloys. Applied Physics Letters, 119 (25). https://doi.org/10.1063/5.0074304

Muhowski, A. J., March, S. D., Maddox, S. J., Wasserman, D., and Bank, S. R. "Minority carrier lifetimes in digitally-grown, narrow-gap, AlInAsSb alloys". Applied Physics Letters 119 (25). Country unknown/Code not available: American Institute of Physics. https://doi.org/10.1063/5.0074304. https://par.nsf.gov/biblio/10360932.

@article{osti_10360932,
place = {Country unknown/Code not available}, title = {Minority carrier lifetimes in digitally-grown, narrow-gap, AlInAsSb alloys}, url = {https://par.nsf.gov/biblio/10360932}, DOI = {10.1063/5.0074304}, abstractNote = {Not Available}, journal = {Applied Physics Letters}, volume = {119}, number = {25}, publisher = {American Institute of Physics}, author = {Muhowski, A. J. and March, S. D. and Maddox, S. J. and Wasserman, D. and Bank, S. R.}, }