Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana, and Ray, Biswajit. Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application. Retrieved from https://par.nsf.gov/biblio/10381595. IEEE Transactions on Nuclear Science 69.3 Web. doi:10.1109/TNS.2021.3125652.

Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana, & Ray, Biswajit. Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application. IEEE Transactions on Nuclear Science, 69 (3). Retrieved from https://par.nsf.gov/biblio/10381595. https://doi.org/10.1109/TNS.2021.3125652

Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana, and Ray, Biswajit. "Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application". IEEE Transactions on Nuclear Science 69 (3). Country unknown/Code not available. https://doi.org/10.1109/TNS.2021.3125652. https://par.nsf.gov/biblio/10381595.

@article{osti_10381595,
place = {Country unknown/Code not available}, title = {Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application}, url = {https://par.nsf.gov/biblio/10381595}, DOI = {10.1109/TNS.2021.3125652}, abstractNote = {}, journal = {IEEE Transactions on Nuclear Science}, volume = {69}, number = {3}, author = {Kumari, Preeti and Surendranathan, Umeshwarnath and Wasiolek, Maryla and Hattar, Khalid and Bhat, Narayana and Ray, Biswajit}, }